Research Catalog

Interferometric metrology : 20-21, August 1987, San Diego, California

Title
Interferometric metrology : 20-21, August 1987, San Diego, California / sponsored by SPIE, the International Society for Optical Engineering, cooperating organizations: Applied Optics Laboratory, New Mexico State University [and others]; N.A. Massie, editor.
Publication
Bellingham, Wash. : SPIE--the International Society for Optical Engineering, [1988], ©1988.

Items in the Library & Off-site

Filter by

1 Item

StatusFormatAccessCall NumberItem Location
Request for On-site UseRequest Scan
How do I pick up this item and when will it be ready?
TextRequest in advance QC367 .I54 1988gOff-site

Holdings

Details

Additional Authors
  • Massie, N. A.
  • New Mexico State University. Applied Optics Laboratory.
  • Society of Photo-optical Instrumentation Engineers.
Description
vi, 239 pages : illustrations; 28 cm.
Series Statement
  • SPIE ; v. 816
  • Critical reviews of optical science and technology
Uniform Title
  • Proceedings of SPIE--the International Society for Optical Engineering ; v. 816.
  • Critical reviews of optical science and technology.
Subjects
Note
  • Includes index.
OCLC
  • 18656084
  • ocm18656084
Owning Institutions
Columbia University Libraries