Research Catalog

Performance and reliability of semiconductor devices : symposium held November 30-December 3, 2008, Boston, Massachusetts, U.S.A.

Title
Performance and reliability of semiconductor devices : symposium held November 30-December 3, 2008, Boston, Massachusetts, U.S.A. / editors, M. Mastro [and others].
Publication
Warrendale, Pa. : Materials Research Society, [2009], ©2009.

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Details

Additional Authors
  • Mastro, Michael, 1949-
  • Materials Research Society.
  • Materials Research Society. Fall Meeting (2008 : Boston, Mass.)
  • Symposium on Performance and Reliability of Semiconductor Devices (2008 : Boston, Mass.)
Description
xiii pages, 3 unnumbered pages, 259 pages : illustrations; 24 cm.
Series Statement
MRS proceedings ; v. 1108
Uniform Title
Materials Research Society symposia proceedings ; v. 1108.
Subject
  • Semiconductors > Congresses
  • Semiconductors > Defects > Congresses
  • Semiconductors > Reliability > Congresses
Note
  • "Symposium A, "Performance and Reliability of Semiconductor Devices," ... held November 30-December 3 at ... MRS Fall Meeting in Boston..." -- preface (p. xi)
Bibliography (note)
  • Includes bibliographical references and indexes.
Contents
Gallium Nitride Electronic Devices -- Nano-Engineered Devices -- Performance of Semiconductor Devices -- Advanced Materials and Devices.
ISBN
  • 9781605110806
  • 1605110809
OCLC
  • ocn320436779
  • 320436779
  • SCSB-5469282
Owning Institutions
Columbia University Libraries