Research Catalog
Microelectronic reliability
- Title
- Microelectronic reliability / [edited by] Edward B. Hakim.
- Publication
- Norwood, MA : Artech House, ©1989-
Items in the Library & Off-site
Filter by
2 Items
Status | Vol/Date | Format | Access | Call Number | Item Location |
---|---|---|---|---|---|
v.1 | Text | Request in advance | TK7871.85 .M517 1989 v.1 | Off-site | |
v.2 | Text | Request in advance | TK7871.85 .M517 1989 v.2 | Off-site |
Holdings
Details
- Additional Authors
- Hakim, Edward B.
- Description
- volumes : illustrations; 24 cm.
- Series Statement
- Artech House materials science library
- Uniform Title
- Artech House materials science library.
- Subject
- Bibliography (note)
- Includes bibliographies and index.
- Contents
- v. 1. Reliability, test and diagnostics -- v. 2. Integrity assessment and assurance.
- ISBN
- 0890062846 (v. 1) :
- LCCN
- 88007814
- OCLC
- 18629793
- ocm18629793
- Owning Institutions
- Columbia University Libraries