Research Catalog

X-ray microscopy II : proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987

Title
X-ray microscopy II : proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987 / D. Sayre [and others].
Publication
Berlin ; New York : Springer-Verlag, 1988.

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Details

Additional Authors
  • Sayre, David.
  • International Symposium on X-ray Microscopy (2nd : 1987 : Brookhaven, N.Y.)
Description
xiv, 454 pages : illustrations; 24 cm.
Series Statement
Springer series in optical sciences ; v. 56
Uniform Title
Springer series in optical sciences ; v. 56.
Subject
Note
  • Based on papers presented at the International Symposium on X-ray Microscopy held at Brookhaven National Laboratory.
Bibliography (note)
  • Includes bibliographies and index.
ISBN
0387193928 (U.S.)
LCCN
88020043
OCLC
  • 264983111
  • ocn264983111
Owning Institutions
Columbia University Libraries