Research Catalog

Proceedings of the symposia on reliability of semiconductor devices and interconnection and multilevel metallization, interconnection, and contact technologies

Title
Proceedings of the symposia on reliability of semiconductor devices and interconnection and multilevel metallization, interconnection, and contact technologies / edited by Harzara S. Rathore, Geraldine C. Schwartz, Robin A. Susko ; [sponsored by] Dielectrics and Insulation and Electronics divisions.
Publication
Pennington, NJ (10 S. Main St., Pennington 08534-2896) : Electrochemical Society, [1989], ©1989.

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Details

Additional Authors
  • Rathore, Harzara S.
  • Schwartz, G. C.
  • Susko, R. A. (Robin A.)
  • Electrochemical Society. Dielectrics and Insulation Division.
  • Electrochemical Society. Electronics Division.
Description
viii, 495 pages : illustrations; 23 cm.
Series Statement
Proceedings ; v. 89-6
Uniform Title
Proceedings (Electrochemical Society) ; v. 89-6.
Alternative Title
Reliability of semiconductor devices and interconnection and multilevel metallization, interconnection, and contact technologies.
Subjects
Note
  • Spine title: Reliability of semiconductor devices and interconnection and multilevel metallization, interconnection, and contact technologies.
  • "Held during the fall meeting of the Electrochemical Society, October 9 to 14, 1988"--Pref.
Bibliography (note)
  • Includes bibliographical references.
LCCN
89083803
OCLC
  • 20357147
  • ocm20357147
Owning Institutions
Columbia University Libraries