Research Catalog

Testing and reliable design of CMOS circuits

Title
Testing and reliable design of CMOS circuits / by Niraj K. Jha. and Sandip Kundu.
Author
Jha, Niraj K.
Publication
Boston : Kluwer Academic Publishers, [1990], ©1990.

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Details

Additional Authors
Kundu, Sandip.
Description
xii, 231 pages : illustrations; 25 cm.
Series Statement
Kluwer international series in engineering and computer science ; SECS 88. VLSI, computer architecture, and digital signal processing
Uniform Title
Kluwer international series in engineering and computer science. VLSI, computer architecture, and digital signal processing.
Subject
  • Metal oxide semiconductors, Complementary > Testing
  • Metal oxide semiconductors, Complementary > Reliability
  • Integrated circuits > Design and construction
Bibliography (note)
  • Includes bibliographical references.
ISBN
0792390563
LCCN
89037031
OCLC
  • 20490432
  • ocm20490432
Owning Institutions
Columbia University Libraries