Research Catalog

Protocol test systems : proceedings of the IFIP TC6 Second International Workshop on Protocol Test Systems, organized by GMD-FOKUS and IBM-ENC, Berlin, F.R.G., 3-6 October 1989

Title
Protocol test systems : proceedings of the IFIP TC6 Second International Workshop on Protocol Test Systems, organized by GMD-FOKUS and IBM-ENC, Berlin, F.R.G., 3-6 October 1989 / edited by Jan de Meer, Lothar Mackert, Wolfgang Effelsberg.
Author
IFIP TC6 International Workshop on Protocol Test Systems (2nd : 1989 : Berlin, Germany)
Publication
Amsterdam ; New York : North-Holland ; New York, N.Y. : Distributors for the U.S. and Canada, Elsevier Pub. Co., 1990.

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Details

Additional Authors
  • Meer, Jan de.
  • Mackert, Lothar.
  • Effelsberg, Wolfgang.
  • International Federation for Information Processing. Technical Committee.
Description
x, 371 pages : illustrations; 23 cm
Subject
Bibliography (note)
  • Includes bibliographical references.
ISBN
0444885633 (U.S.)
LCCN
90006869
OCLC
  • 21117068
  • ocm21117068
Owning Institutions
Columbia University Libraries