Research Catalog
Reliability and degradation : semiconductor devices and circuits / edited by M.J. Howes and D.V. Morgan.
- Title
- Reliability and degradation : semiconductor devices and circuits / edited by M.J. Howes and D.V. Morgan.
Items in the Library & Off-site
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1 Item
| Status | Format | Access | Call Number | Item Location |
|---|---|---|---|---|
Not available - Please for assistance. | Text | Use in library | TK7870 .R4 1981 | Off-site |
Details
- Additional Authors
- Description
- xii, 444 p. : ill.; 23 cm.
- Series Statement
- Wiley series in solid state devices and circuits
- Subject
- ISBN
- 0471280283
- LCCN
- 80042310
- Owning Institutions
- Columbia University Libraries