Research Catalog
Secondary ion mass spectrometry : a practical handbook for depth profiling and bulk impurity analysis
- Title
- Secondary ion mass spectrometry : a practical handbook for depth profiling and bulk impurity analysis / R.G. Wilson, F.A. Stevie, C.W. Magee.
- Author
- Wilson, Robert G.
- Publication
- New York : Wiley, [1989], ©1989.
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1 Item
| Status | Format | Access | Call Number | Item Location |
|---|---|---|---|---|
| Text | Request in advance | QD96.S43 W55 1989 | Off-site |
Holdings
Details
- Additional Authors
- Description
- 1 volume (various pagings) : illustrations; 26 cm
- Subject
- Secondary ion mass spectrometry
- Note
- "A Wiley-Interscience publication.
- Bibliography (note)
- Includes bibliographical references.
- ISBN
- 0471519456
- LCCN
- 89022460
- OCLC
- 20168488
- ocm20168488
- Owning Institutions
- Columbia University Libraries