Research Catalog
High resolution electron microscopy of defects in materials : symposium held April 16-18, 1990, San Francisco, California, U.S.A.
- Title
- High resolution electron microscopy of defects in materials : symposium held April 16-18, 1990, San Francisco, California, U.S.A. / editors, Robert Sinclair, David J. Smith, Ulrich Dahmen.
- Publication
- Pittsburgh, Pa. : Materials Research Society, [1990], ©1990.
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Status | Format | Access | Call Number | Item Location |
---|---|---|---|---|
Text | Request in advance | TA417.23 .H53 1990 | Off-site |
Holdings
Details
- Additional Authors
- Description
- xi, 391 pages : illustrations; 24 cm.
- Series Statement
- Materials Research Society symposium proceedings, 0272-9172 ; v. 183
- Uniform Title
- Materials Research Society symposia proceedings ; v. 183.
- Subject
- Bibliography (note)
- Includes bibliographical references and indexes.
- ISBN
- 1558990720
- LCCN
- 90041466
- OCLC
- 22117610
- ocm22117610
- Owning Institutions
- Columbia University Libraries