Research Catalog

High resolution electron microscopy of defects in materials : symposium held April 16-18, 1990, San Francisco, California, U.S.A.

Title
High resolution electron microscopy of defects in materials : symposium held April 16-18, 1990, San Francisco, California, U.S.A. / editors, Robert Sinclair, David J. Smith, Ulrich Dahmen.
Publication
Pittsburgh, Pa. : Materials Research Society, [1990], ©1990.

Items in the Library & Off-site

Filter by

1 Item

StatusFormatAccessCall NumberItem Location
TextRequest in advance TA417.23 .H53 1990Off-site

Holdings

Details

Additional Authors
  • Sinclair, Robert.
  • Smith, David J., 1948-
  • Dahmen, Ulrich.
  • Materials Research Society.
Description
xi, 391 pages : illustrations; 24 cm.
Series Statement
Materials Research Society symposium proceedings, 0272-9172 ; v. 183
Uniform Title
Materials Research Society symposia proceedings ; v. 183.
Subject
  • Materials > Microscopy > Congresses
  • Materials > Defects > Congresses
  • Electron microscopy > Congresses
Bibliography (note)
  • Includes bibliographical references and indexes.
ISBN
1558990720
LCCN
90041466
OCLC
  • 22117610
  • ocm22117610
Owning Institutions
Columbia University Libraries