Research Catalog

X-ray/EUV optics for astronomy, microscopy, polarimetry, and projection lithography : proceedings : 9-13 July 1990, San Diego, California

Title
X-ray/EUV optics for astronomy, microscopy, polarimetry, and projection lithography : proceedings : 9-13 July 1990, San Diego, California / Richard B. Hoover, Arthur B.C. Walker, Jr., chairs/editors : sponsored by SPIE--the International Society for Optical Engineering.
Publication
Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, [1991], ©1991.

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Details

Additional Authors
  • Hoover, Richard B.
  • Walker, A. B. C.
  • Society of Photo-optical Instrumentation Engineers.
  • International Symposium on Optical and Optoelectronic Applied Sciences and Engineering (1990 : San Diego, Calif.)
Description
xii, 579 pages : illustrations; 28 cm.
Series Statement
SPIE proceedings series, 0277-786X ; vol. 1343
Uniform Title
Proceedings of SPIE--the International Society for Optical Engineering ; v. 1343.
Subject
  • X-ray astronomy > Congresses
  • X-ray microscopes > Congresses
  • Optical images > Congresses
Note
  • "Conference 1343 ... held at SPIE's International Symposium on Optical and Optoelectronic Applied Science and Engineering"--P. x.
Bibliography (note)
  • Includes bibliographical references and index.
ISBN
0819404047
LCCN
90052838
OCLC
  • 507352088
  • ocn507352088
Owning Institutions
Columbia University Libraries