Research Catalog

VLSI system test, cost versus quality : 1990 IEEE VLSI Test Symposium April 10-11, 1990, Bally's Park Place Casino Hotel, Atlantic City, NJ

Title
VLSI system test, cost versus quality : 1990 IEEE VLSI Test Symposium April 10-11, 1990, Bally's Park Place Casino Hotel, Atlantic City, NJ / IEEE Philadelphia Section, IEEE Computer Society, Test Technology Committee.
Author
IEEE VLSI Test Symposium (1990 : Atlantic City, N.J.)
Publication
Atlantic City, NJ : IEEE Computer Society, 1990.

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Details

Additional Authors
  • Institute of Electrical and Electronics Engineers. Philadelphia Section.
  • IEEE Computer Society. Test Technology Committee.
  • IEEE Test Symposium.
Description
1 volume (unpaged) : illustrations; 28 cm
Alternative Title
VLSI system test: cost vs. quality.
Subject
Application-specific integrated circuits > Congresses
Note
  • Cover title: VLSI system test: cost vs. quality.
  • "IEEE Test Symposium."--Cover.
Bibliography (note)
  • Includes bibliographical references.
OCLC
  • 51467020
  • ocm51467020
Owning Institutions
Columbia University Libraries