Research Catalog

Physical measurement and analysis of thin films, edited by E. M. Murt and W. G. Guldner.

Title
Physical measurement and analysis of thin films, edited by E. M. Murt and W. G. Guldner.
Author
Eastern Analytical Symposium (1967 : New York)
Publication
New York, Plenum Press, 1969.

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Additional Authors
  • Murt, E. M.
  • Guldner, W. G.
Description
xi, 194 p. illus.; 24 cm.
Series Statement
Progress in analytical chemistry ; v. 2
Subject
  • Electron Probe Microanalysis
  • Chemistry Techniques, Analytical
  • Absorptiometry, Photon
  • Thin films
Genre/Form
Congress
Bibliography (note)
  • Includes bibliographies.
Contents
Nondestructive optical techniques for thin-film thickness measurements / by W.A. Pliskin -- A review of x-ray methods for investigating thin films and platings / by Eugene P. Bertin -- X-ray fluorescence and electron microprobe techniques for determination of thin-film thickness / by James E. Cline -- Density determination of sputtered tantalum films by a beta-backscatter technique / by Richard Brown -- The characterization of solid thin films and surfaces by electron microscopy and diffraction / by R.B. Marcus -- The emission-spectrographic and atomic-absorption analyses of metallic thin films / by J.D. Nohe -- RF spark source mass spectrometry for the analysis of surface films / by D.L. Malm -- Chemical and structural evaluation of thin glass films / by W.A. Pliskin.
LCCN
^^^68031239^
OCLC
  • 2113
  • SCSB-13127433
Owning Institutions
Harvard Library