Research Catalog

Title

Electron microscopy and analysis / Peter J. Goodhew, John Humphreys, Richard Beanland.

Author

Goodhew, Peter J.

Publication

London ; New York : Taylor & Francis, c2001.

Items in the Library & Off-site

Holdings

Details

Additional Authors

• Beanland, R.
• Humphreys, F. J.

Description

x, 251 p. : ill.; 24 cm.

Subject

• Electron microscopy
• Microscopy, Electron [MESH]

Bibliography (note)

• Includes bibliographical references (p. [236]-237) and index.

Processing Action (note)

• committed to retain

Contents

1 Microscopy with light and electrons 1 -- 1.2 Methods of image formation 2 -- 1.3 Pixels 3 -- 1.4 Light-optical microscope 4 -- 1.5 Magnification 7 -- 1.6 Resolution 8 -- 1.7 Depth of field and depth of focus 12 -- 1.8 Aberrations in optical systems 14 -- 1.9 Electrons versus light 16 -- 2 Electrons and their interaction with the specimen 20 -- 2.2 Electrons 20 -- 2.3 Generating a beam of electrons 24 -- 2.4 Deflection of electrons--magnetic lenses 27 -- 2.5 Scattering of electrons by atoms 29 -- 2.6 Elastic scattering 30 -- 2.7 Inelastic scattering 31 -- 2.8 Secondary effects 34 -- 2.9 Family of electron microscopes 37 -- 3 Electron diffraction 40 -- 3.1 Geometry of electron diffraction 41 -- 3.2 Diffraction spot patterns 47 -- 3.3 Use of the reciprocal lattice in diffraction analysis 51 -- 3.4 Other types of diffraction pattern 58 -- 4 Transmission electron microscope 66 -- 4.1 Instrument 66 -- 4.2 Contrast mechanisms 76 -- 4.3 High voltage electron microscopy (HVEM) 108 -- 4.4 Scanning transmission electron microscopy (STEM) 110 -- 4.5 Preparation of specimens for TEM 110 -- 5 Scanning electron microscope 122 -- 5.1 How it works 122 -- 5.2 Obtaining a signal in the SEM 124 -- 5.3 Optics of the SEM 131 -- 5.4 Performance of the SEM 133 -- 5.5 Ultimate resolution of the SEM 135 -- 5.6 Topographic images 141 -- 5.7 Compositional images 146 -- 5.8 Crystallographic information from the SEM 149 -- 5.9 Use of other signals in the SEM 153 -- 5.10 Image acquisition, processing and storage 159 -- 5.11 Preparation of specimens for examination in the SEM 162 -- 5.12 Low voltage microscopy 164 -- 5.13 Environmental scanning electron microscopy (ESEM) 166 -- 6 Chemical analysis in the electron microscope 169 -- 6.1 Generation of X-rays within a specimen 170 -- 6.2 Detection and counting of X-rays 174 -- 6.3 X-ray analysis of bulk specimens 184 -- 6.4 X-ray analysis of thin specimens in the TEM 193 -- 6.5 Quantitative analysis in an electron microscope 196 -- 6.6 Electron energy loss spectroscopy (EELS) 205 -- 6.7 A brief comparison of techniques 212 -- 7 Electron microscopy and other techniques 214 -- 7.1 Complementary imaging techniques 214 -- 7.2 Complementary analysis techniques--alternative analysis systems 225 -- 7.3 Complementary diffraction techniques 233.

ISBN

0748409688 (pbk. : alk. paper)

LCCN

^^^00037716^

Owning Institutions

Harvard Library