Research Catalog

Manhattan picture worlds : Thomas Wrede / mit Texten von Christoph Schaden, Marshall Berman.

Title
Manhattan picture worlds : Thomas Wrede / mit Texten von Christoph Schaden, Marshall Berman.
Author
Wrede, Thomas, 1963-
Publication
Bielefeld : Kerber, 2009.

Holdings

Details

Additional Authors
  • Beck & Eggeling.
  • Berman, Marshall, 1940-
  • Schaden, Christoph.
Description
115 p. : col. ill.; 32 cm.
Series Statement
Kerber photoart
Uniform Title
Kerber photoart
Subject
Wrede, Thomas, 1963- > Exhibitions
Note
  • Published in conjunction with an exhibition at Beck & Eggeling, Dusseldorf, Germany, Mar. 5-Apr. 25, 2009.
Language (note)
  • Texts in German and English.
Processing Action (note)
  • committed to retain
ISBN
  • 9783866782440 (hd.bd.)
  • 3866782446 (hd.bd.)