Research Catalog
Scanning electron microscopy and x-ray microanalysis / Joseph I. Goldstein ... [et al.].
- Title
- Scanning electron microscopy and x-ray microanalysis / Joseph I. Goldstein ... [et al.].
- Publication
- New York : Springer, c2003.
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1 Item
| Status | Format | Access | Call Number | Item Location |
|---|---|---|---|---|
| Text | Request in advance | QH212.S3 S29 2003 | Off-site |
Details
- Additional Authors
- Goldstein, Joseph, 1939-2015
- Description
- xix, 690 p. : ill. (some col.); 26 cm. +
- Subject
- Genre/Form
- CD-ROMs.
- Bibliography (note)
- Includes bibliographical references and index.
- Processing Action (note)
- committed to retain
- Contents
- 1. Introduction -- 2. The SEM and its modes of operation -- 3. Electron beam-specimen interactions -- 4. Image formation and interpretation -- 5. Special topics in scanning electron microscopy -- 6. Generation of x-rays in the SEM specimen -- 7. X-ray spectral measurement: EDS and WDS -- 8. Qualitative x-ray analysis -- 9. Quantitative x-ray analysis : the basics -- 10. Special topics in electron beam x-ray microanalysis -- 11. Specimen preparation of hard materials : metals, ceramics, rocks, minerals, microelectronic and packaged devices, particles, and fibers -- 12. Specimen preparation of polymer materials -- 13. Ambient-temperature specimen preparation of biological material -- 14. Low-temperature specimen preparation -- 15. Procedures for elimination of charging in nonconducting specimens.
- ISBN
- 9780306472923
- LCCN
- ^^2002028276
- OCLC
- 65288376
- SCSB-10226308
- Owning Institutions
- Harvard Library