Research Catalog

13th IEEE VLSI Test Symposium : April 30-May 3, 1995, Princeton, New Jersey : proceedings /

Title
13th IEEE VLSI Test Symposium : April 30-May 3, 1995, Princeton, New Jersey : proceedings / sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Philadelphia Section.
Author
IEEE VLSI Test Symposium (13th : 1995 : Princeton, N.J.)
Publication
Los Alamitos, Calif. : IEEE Computer Society Press, c1995.

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Details

Additional Authors
  • IEEE Computer Society. Test Technology Technical Committee. http://id.loc.gov/authorities/names/n88164000
  • Institution of Electrical and Electronics Engineers. Philadelphia Section.
Description
xx, 493 p. : ill.; 28 cm.
Alternative Title
Thirteenth IEEE VLSI Test Symposium
Subject
Integrated circuits > Congresses
Bibliography (note)
  • Includes bibliographical references and index.
ISBN
0818670002 (pbk.)
LCCN
94072870
Owning Institutions
Princeton University Library