Research Catalog

25th anniversary compendium of papers from International Test Conference /

Title
25th anniversary compendium of papers from International Test Conference / edited by Paul H. Bardell ... [et al.].
Author
International Test Conference (25th : 1994 : Philadelphia, Pa.)
Publication
Los Alamitos, Calif. : IEEE Computer Society Press, c1994.

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Details

Additional Authors
  • IEEE Computer Society. Philadelphia Chapter. http://id.loc.gov/authorities/names/n80060677
  • IEEE Computer Society. http://id.loc.gov/authorities/names/n79043202
  • Institute of Electrical and Electronics Engineers. http://id.loc.gov/authorities/names/n79053217
Description
xv, 794 p. : ill.; 28 cm.
Alternative Title
  • Compendium of papers from International Test Conference.
  • Twenty-fifth anniversary compendium of papers from International Test Conference.
Subjects
Note
  • Spine title: Compendium of papers from International Test Conference.
  • At head of title: 1970-1994.
  • "IEEE catalog number EH04085 ; IEEE Computer Society Press order number 6617-01"--T.p. verso.
Bibliography (note)
  • Includes bibliographical references and index.
ISBN
081866617X
LCCN
94077462
Owning Institutions
Princeton University Library