Research Catalog
Physical measurement and analysis of thin films,
- Title
- Physical measurement and analysis of thin films, edited by E. M. Murt and W. G. Guldner.
- Author
- Eastern Analytical Symposium (1967 : New York)
- Publication
- New York, Plenum Press, 1969.
Items in the Library & Off-site
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1 Item
| Status | Format | Access | Call Number | Item Location |
|---|---|---|---|---|
Not available - Please for assistance. | Text | Use in library | QC176 .E2 1967 | Off-site |
Details
- Additional Authors
- Description
- xi, 194 p. illus.; 24 cm.
- Series Statement
- Progress in analytical chemistry v. 2
- Subject
- Bibliography (note)
- Includes bibliographies.
- LCCN
- 68031239
- Owning Institutions
- Princeton University Library