Research Catalog

Measurement techniques for thin films /

Title
Measurement techniques for thin films / edited by Bertram Schwartz and Newton Schwartz.
Publication
New York : Johnson Reprint Corp., 1968, c1967.

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Details

Additional Authors
  • Electrochemical Society. Dielectrics and Insulation Division. http://id.loc.gov/authorities/names/n79124668
  • Electrochemical Society. Electronics Division. http://id.loc.gov/authorities/names/n79124670
  • Schwartz, Bertram.
  • Schwartz, Newton.
Description
vi, 364 p. : ill.; 22 cm.
Subject
  • Metallic films > Congresses
  • Thin films > Congresses
Note
  • Consists of most of the papers presented at two symposia: a symposium held in Buffalo, N.Y., Oct. 11, 1965, and sponsored by the Electronics Division of the Electrochemical Society; and a symposium held in Philadelphia Oct. 10-11, 1966, and sponsored jointly by the Electronics Division and the Dielectrics and Insulation Division of the Electrochemical Society.
  • Reprint of 1967 ed. published by the Electronics Division and Dielectrics and Insulation Division, the Electrochemical Society, New York.
Bibliography (note)
  • Includes bibliographical references and index.
LCCN
67019860
Owning Institutions
Princeton University Library