Research Catalog
Methods of measurement for semiconductor materials, process control, and devices; quarterly report.
- Title
- Methods of measurement for semiconductor materials, process control, and devices; quarterly report.
- Author
- United States. National Bureau of Standards. http://id.loc.gov/authorities/names/n79021148
- Publication
- [Washington, For sale by the Supt. of Docs., U.S. Govt. Print. Off.]
Items in the Library & Off-site
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4 Items
| Status | Format | Access | Call Number | Item Location |
|---|---|---|---|---|
Not available - Please for assistance. | Text | Use in library | 9280.921 Apr.-Jun. 1969 | Off-site |
Not available - Please for assistance. | Text | Use in library | 9280.921 Jul-Sep. 1968 | Off-site |
Not available - Please for assistance. | Text | Use in library | 9280.921 Oct.-Dec. 1968 | Off-site |
Not available - Please for assistance. | Text | Use in library | 9280.921 Oct.-Dec. 1969 | Off-site |
Holdings
Details
- Description
- v. ill.; 25 cm.
- Series Statement
- NBS technical note
- Alternative Title
- Methods of measurement for semiconductor materials, process control, and devices. Quarterly report
- Subject
- ISSN
- 0090-8541
- LCCN
- 73642169 //r82
- Owning Institutions
- Princeton University Library