Research Catalog

Secondary ion mass spectrometry : SIMS IV : proceedings of the fourth international conference, Osaka, Japan, November 13-19, 1983 /

Title
Secondary ion mass spectrometry : SIMS IV : proceedings of the fourth international conference, Osaka, Japan, November 13-19, 1983 / editors: A. Benninghoven, J. Okana, R. Shimizu, and H.W. Werner.
Author
International Conference on Secondary Ion Mass Spectrometry (4th : 1983 : Osaka, Japan)
Publication
Berlin ; New York : Springer-Verlag, 1984.

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Details

Additional Authors
  • Benninghoven, A.
  • Okano, J. (Jun), 1926-
  • Shimizu, R. (Ryuichi), 1937-
Description
xv, 503 p. : ill.; 24 cm.
Series Statement
Springer series in chemical physics ; v. 36
Subject
Secondary ion mass spectrometry > Congresses
Bibliography (note)
  • Includes bibliographical references and index.
ISBN
038713316X
LCCN
84005330
Owning Institutions
Princeton University Library