Research Catalog
Electron-beam, x-ray, & ion-beam techniques for submicrometer lithographies V : 11-12 March 1986, Santa Clara, California /
- Title
- Electron-beam, x-ray, & ion-beam techniques for submicrometer lithographies V : 11-12 March 1986, Santa Clara, California / Phillip D. Blais, chairman/editor.
- Publication
- Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1986.
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Status | Format | Access | Call Number | Item Location |
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Not available - Please for assistance. | Text | Use in library | TK7874 .E434 | Off-site |
Details
- Additional Authors
- Blais, Phillip D.
- Description
- vi, 272 p. : ill.; 28 cm.
- Series Statement
- Proceedings of SPIE--the International Society for Optical Engineering ; v. 632
- Subject
- Bibliography (note)
- Includes bibliographies and index.
- ISBN
- 089252667X
- LCCN
- 86061034
- Owning Institutions
- Princeton University Library