Research Catalog
2nd European Congress on Optics Applied to Metrology (METROP) : presented as part of the Optics, Photonics, and Iconics Engineering Meeting (OPIEM), November 26-30, 1979, Strasbourg, France /
- Title
- 2nd European Congress on Optics Applied to Metrology (METROP) : presented as part of the Optics, Photonics, and Iconics Engineering Meeting (OPIEM), November 26-30, 1979, Strasbourg, France / editors, Michel Grosmann, Patrick Meyrueis ; organized by European Photonics Association in collaboration with the Society of Photo-optical Instrumentation Engineers.
- Author
- Optics, Photonics, and Iconics Engineering Meeting (1979 : Strasbourg, France)
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| Status | Format | Access | Call Number | Item Location |
|---|---|---|---|---|
Not available - Please for assistance. | Text | Use in library | TA1522 .E97 1979 | Off-site |
Details
- Additional Authors
- Description
- x, 228 p. : ill.; 28 cm.
- Series Statement
- Proceedings of the Society of Photo-optical Instrumentation Engineers ; v. 210
- Subjects
- ISBN
- 0892522380
- LCCN
- 80127941
- Owning Institutions
- Princeton University Library