Research Catalog

Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A. / editors, Noble M. Johnson, Stephen G. Bishop, George D. Watkins.

Title
Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A. / editors, Noble M. Johnson, Stephen G. Bishop, George D. Watkins.
Publication
Pittsburgh, Pa. : Materials Research Society, c1985.

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Details

Additional Authors
  • Bishop, Stephen G.
  • Johnson, Noble M.
  • Materials Research Society. http://id.loc.gov/authorities/names/n79060208
  • Watkins, George D.
Description
xv, 604 p. : ill.; 24 cm.
Series Statement
Materials Research Society symposia proceedings, 0272-9172 ; v. 46
Subjects
Bibliography (note)
  • Includes bibliographies and indexes.
ISBN
0931837111 :
LCCN
85019753
Owning Institutions
Princeton University Library