Research Catalog
Stress induced phenomena in metallization : sixth international workshop, Ithaca, New York, 25-27 July, 2002 /
- Title
- Stress induced phenomena in metallization : sixth international workshop, Ithaca, New York, 25-27 July, 2002 / editors, Shefford P. Baker ... [et al.].
- Author
- International Workshop on Stress-Induced Phenomena in Metallization (6th : 2001 : Ithaca, New York)
- Publication
- Melville, N.Y. : American Institute of Physics, 2002.
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Status | Format | Access | Call Number | Item Location |
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Not available - Please for assistance. | Text | Use in library | TK7871.85 .S768 2002 | Off-site |
Details
- Additional Authors
- Baker, Shefford P.
- Description
- ix, 250 p. : ill.; 24 cm.
- Series Statement
- AIP conference proceedings ; 612
- Uniform Title
- AIP conference proceedings ; no. 612
- Subjects
- Electrodiffusion > Congresses
- Liquid crystal devices > Defects > Congresses
- Integrated circuits > Defects > Congresses
- Aluminum films > Congresses
- Thin film devices > Defects > Congresses
- Electrochemical metallizing > Congresses
- Acoustic surface wave devices > Defects > Congresses
- Semiconductors > Defects > Congresses
- Metallic films > Congresses
- Bibliography (note)
- Includes bibliographical references and index.
- Additional Formats (note)
- Also available in an electronic version.
- ISBN
- 073540058X
- LCCN
- 22102851
- Owning Institutions
- Princeton University Library