Research Catalog
X-ray microscopy II : proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987 /
- Title
- X-ray microscopy II : proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987 / D. Sayre ... [et al.].
- Publication
- Berlin ; New York : Springer-Verlag, 1988.
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Status | Format | Access | Call Number | Item Location |
---|---|---|---|---|
Not available - Please for assistance. | Text | Use in library | QH212.X2 X23 1988 | Off-site |
Details
- Additional Authors
- Description
- xiv, 454 p. : ill.; 24 cm.
- Series Statement
- Springer series in optical sciences ; v. 56
- Subject
- Note
- Based on papers presented at the International Symposium on X-ray Microscopy held at Brookhaven National Laboratory.
- Bibliography (note)
- Includes bibliographies and index.
- ISBN
- 0387193928 (U.S.)
- LCCN
- 88020043
- Owning Institutions
- Princeton University Library