Research Catalog

Interferometric metrology : 20-21, August 1987, San Diego, California /

Title
Interferometric metrology : 20-21, August 1987, San Diego, California / sponsored by SPIE ; cooperating organizations, Applied Optics Laboratory, New Mexico State University ... [et al.] ; editor, N.A. Massie.
Publication
Bellingham, Wash. : SPIE--the International Society for Optical Engineering, c1988.

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Details

Additional Authors
  • Massie, N. A.
  • New Mexico State University. Applied Optics Laboratory. http://id.loc.gov/authorities/names/n87905402
  • Society of Photo-optical Instrumentation Engineers. http://id.loc.gov/authorities/names/n78088934
Description
vi, 239 p. : ill.; 28 cm.
Series Statement
  • Critical reviews of optical science and technology
  • SPIE ; v.816
Uniform Title
Proceedings of SPIE--the International Society for Optical Engineering ; v.816
Subject
  • Interferometry > Congresses
  • Laser speckle > Congresses
  • Optical measurements > Congresses
  • Speckle metrology > Congresses
Bibliography (note)
  • Includes bibliographical references and author index.
ISBN
0892528516
LCCN
87062557
Owning Institutions
Princeton University Library