Research Catalog
Interferometric metrology : 20-21, August 1987, San Diego, California /
- Title
- Interferometric metrology : 20-21, August 1987, San Diego, California / sponsored by SPIE ; cooperating organizations, Applied Optics Laboratory, New Mexico State University ... [et al.] ; editor, N.A. Massie.
- Publication
- Bellingham, Wash. : SPIE--the International Society for Optical Engineering, c1988.
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Details
- Additional Authors
- Description
- vi, 239 p. : ill.; 28 cm.
- Series Statement
- Critical reviews of optical science and technology
- SPIE ; v.816
- Uniform Title
- Proceedings of SPIE--the International Society for Optical Engineering ; v.816
- Subject
- Bibliography (note)
- Includes bibliographical references and author index.
- ISBN
- 0892528516
- LCCN
- 87062557
- Owning Institutions
- Princeton University Library