Research Catalog

A manual wafer probe station for an integrated circuit test system /

Title
A manual wafer probe station for an integrated circuit test system / G.P. Carver and W.A. Cullins.
Author
Carver, G. P.
Publication
Washington, D.C. : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. G.P.O., 1981.

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Details

Additional Authors
  • Center for Electronics and Electrical Engineering (U.S.). Electron Devices Division. http://id.loc.gov/authorities/names/n78089737
  • Cullins, W. C.
  • United States. National Bureau of Standards. http://id.loc.gov/authorities/names/n79021148
Description
iv, 14 p. : ill.; 26 cm.
Series Statement
  • NBS special publication ; 400-68
  • Semiconductor measurement technology
Subject
  • Integrated circuits > Testing
  • Probes (Electronic instruments)
Note
  • "Electron Devices Division, Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards."
  • "Issued May 1981."
  • S/N 003-003-02319-1.
  • Item 247.
Bibliography (note)
  • Includes bibliographical references.
LCCN
81600033
Owning Institutions
Princeton University Library