Research Catalog
Semiconductor characterization techniques : proceedings of the Topical Conference on Characterization Techniques for Semiconductor Materials and Devices /
- Title
- Semiconductor characterization techniques : proceedings of the Topical Conference on Characterization Techniques for Semiconductor Materials and Devices / edited by Peter A. Barnes, George A. Rozgonyi, assistant editors, C. L. Anderson ... [et al. ; sponsored by] Elecronics Division.
- Author
- Topical Conference on Characterization Techniques for Semiconductor Materials and Devices, Seattle, 1978.
- Publication
- Princeton, N.J. : Electrochemical Society, c1978.
Items in the Library & Off-site
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1 Item
Status | Format | Access | Call Number | Item Location |
---|---|---|---|---|
Not available - Please for assistance. | Text | Use in library | TK7871.85 .T65 1978 | Off-site |
Details
- Additional Authors
- Description
- xi, 532 p. : ill.; 23 cm.
- Series Statement
- Proceedings - The Electrochemical Society ; v. 78-3
- Uniform Title
- Proceedings (Electrochemical Society) ; v. 78-3.
- Subject
- Bibliography (note)
- Includes bibliographical references and indexes.
- LCCN
- 78067994
- Owning Institutions
- Princeton University Library