Research Catalog

Title

Magnetic memory : fundamentals and technology / Denny D. Tang, Yuan-Jen Lee.

Author

Tang, Denny D.

Publication

New York : Cambridge University Press, 2010.

Items in the Library & Off-site

Details

Additional Authors

Lee, Yuan-Jen.

Description

x, 196 p. : ill.; 26 cm.

Summary

"If you are a semiconductor engineer or a magnetics physicist developing magnetic memory, get the information you need with this, the first book on magnetic memory. From magnetics to the engineering design of memory, this practical book explains key magnetic properties and how they are related to memory performance, characterization methods of magnetic films, and tunneling magnetoresistance effect devices. It also covers memory cell options, array architecture, circuit models, and read-write engineering issues. You'll understand the soft fail nature of magnetic memory, which is very different from that of semiconductor memory, as well as methods to deal with the issue. You'll also get invaluable problem-solving insights from real-world memory case studies. This is an essential book for semiconductor engineers who need to understand magnetics, and for magnetics physicists who work with MRAM. It is also a valuable reference for graduate students working in electronic/magnetic device research"--Provided by publisher.

Subject

Magnetic memory (Computers)

Bibliography (note)

• Includes bibliographical references and index.

Contents

Machine generated contents note: 1. Basic magnetostatics; 2. Magnetic films; 3. Properties of patterned ferromagnetic film; 4. Magnetoresistance effects and memory devices; 5. Field-write mode MRAMs; 6. Spin torque transfer MRAM; 7. Applications of MTJ based technology; Appendices: A. Unit conversion table cgs vs. SI; B. Dimensions of magnetism; C. Physical constants; D. Normal (Gaussian) distribution and quantile plot; E. Weibull distribution; F. TDDB reliability test of thin film; G. Binomial distribution and Poisson distribution; H. Defect density; I. Fe, Co, Ni element chemistry parameters; J. Soft error, hard fail and design margin.

ISBN

• 9780521449649 (hardback)
• 0521449642 (hardback)

LCCN

2009051398

Owning Institutions

Princeton University Library