Research Catalog
Extreme statistics in nanoscale memory design /
- Title
- Extreme statistics in nanoscale memory design / Amith Singhee, Rob A. Rutenbar, editors.
- Publication
- New York : Springer, c2010.
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Status | Format | Access | Call Number | Item Location |
---|---|---|---|---|
Not available - Please for assistance. | Text | Use in library | TK7895.M3 E98 2010 | Off-site |
Details
- Additional Authors
- Description
- ix, 246 p. : ill.; 25 cm.
- Series Statement
- Integrated circuits and systems
- Uniform Title
- Integrated circuits and systems.
- Subject
- Bibliography (note)
- Includes bibliographical references and index.
- ISBN
- 9781441966056 (hbk.)
- 1441966056 (hbk.)
- Owning Institutions
- Princeton University Library