Research Catalog
Advances in speckle metrology and related techniques /
- Title
- Advances in speckle metrology and related techniques / edited by Guillermo H. Kaufmann.
- Publication
- Weinheim : Wiley-VCH, c2011.
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| Status | Format | Access | Call Number | Item Location |
|---|---|---|---|---|
Not available - Please for assistance. | Text | Use in library | TA1555 .A38 2011 | Off-site |
Details
- Additional Authors
- Kaufmann, Guillermo H.
- Description
- xviii, 309 p. : ill.; 25 cm.
- Subject
- Bibliography (note)
- Includes bibliographical references and index.
- Contents
- Radial Speckle Interferometry and Applications / Armando Albertazzi Gonçalves, Matías R Viotti -- Depth-Resolved Displacement Field Measurement / Jonathan M Huntley, Pablo D Ruiz -- Single-Image Interferogram Demodulation / Manuel Servin, Julio Estrada, Antonio Quiroga -- Phase Evaluation in Temporal Speckle Pattern Interferometry Using Time-Frequency Methods / Alejandro Federico, Guillermo H Kaufmann -- Optical Vortex Metrology / Wei Wang, Steen G Hanson, Mitsuo Takeda -- Speckle Coding for Optical and Digital Data Security Applications / Arvind Kumar, Madan Singh, Kehar Singh.
- ISBN
- 9783527409570 (hbk.)
- 3527409572 (hbk.)
- Owning Institutions
- Princeton University Library