Research Catalog

Statistical performance analysis and modeling techniques for nanometer VLSI designs /

Title
Statistical performance analysis and modeling techniques for nanometer VLSI designs / Ruijing Shen, X.-D. Sheldon, Hao Yu.
Author
Shen, Ruijing.
Publication
New York ; London : Springer, 2012.

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TextUse in library TK7874.75 .S54 2012Off-site

Details

Additional Authors
  • Tan, Sheldon X. D.
  • Yu, Hao.
Description
xxix, 305 p. : ill.; 25 cm.
Subjects
Bibliography (note)
  • Includes bibliographical references (p. 287-297) and index.
ISBN
  • 9781461407874 (hbk.)
  • 1461407877 (hbk.)
Owning Institutions
Princeton University Library