Research Catalog

Proceedings, International Test Conference, 1992.

Title
Proceedings, International Test Conference, 1992.
Author
International Test Conference (23rd : 1992 : Baltimore, Md.)

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Details

Additional Authors
IEEE Computer Society. Test Technology Technical Committee. http://id.loc.gov/authorities/names/n88164000
Description
xii, 1012 p. : ill.; 29 cm.
Subject
  • Automatic test equipment > Congresses
  • Integrated circuits > Testing > Congresses
  • Semiconductors > Testing > Congresses
ISBN
  • 0780307607 (case)
  • 0818631678
LCCN
92073585
Owning Institutions
Princeton University Library