Research Catalog

Optical characterization techniques for semiconductor technology : April 1-2, 1981, San Jose, California /

Title
Optical characterization techniques for semiconductor technology : April 1-2, 1981, San Jose, California / D.E. Aspnes, S. So, R.F. Potter, editors.
Publication
Bellingham, Wash. : Society of Photo-optical Instrumentation Engineers, 1981.

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Details

Additional Authors
  • Aspnes, D. E.
  • Potter, Roy F.
  • So, S. (Samuel S.)
Description
x, 262 p. : ill.; 28 cm.
Series Statement
Proceedings of the Society of Photo-optical Instrumentation Engineers ; v. 276
Subject
Semiconductors > Congresses
Bibliography (note)
  • Includes bibliographical references and indexes.
ISBN
0892523093 (pbk.)
LCCN
81051404
Owning Institutions
Princeton University Library