Research Catalog

Scanning probe microscopies II : 18-19 January 1993, Los Angeles, California /

Title
Scanning probe microscopies II : 18-19 January 1993, Los Angeles, California / Clayton C. Williams, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering.

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Details

Additional Authors
  • Society of Photo-optical Instrumentation Engineers. http://id.loc.gov/authorities/names/n78088934
  • Williams, Clayton C. (Clayton Covey)
Description
ix, 220 p.; 28 cm.
Series Statement
SPIE proceedings series ; v. 1855
Subject
  • Probes (Electronic instruments) > Congresses
  • Scanning electron microscopes > Congresses
ISBN
0819410810
LCCN
93083323
Owning Institutions
Princeton University Library