Research Catalog

Spectroscopic characterization techniques for semiconductor technology V : 25-26 January 1994, Los Angeles, California /

Title
Spectroscopic characterization techniques for semiconductor technology V : 25-26 January 1994, Los Angeles, California / Orest J. Glembocki, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering : cooperating organization-- Center for Advanced Technology for Ultrafast Photonic Materials and Applications, City University of New York.

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Details

Additional Authors
  • City University of New York. Center for Advanced Technology for Ultrafast Photonic Materials and Applications. http://id.loc.gov/authorities/names/nr94023987
  • Glembocki, O. J.
  • Society of Photo-optical Instrumentation Engineers. http://id.loc.gov/authorities/names/n78088934
Description
v, 220 p. : ill.; 28 cm.
Series Statement
Proceedings / SPIE--the International Society for Optical Engineering, 0277-786X ; v. 2141
Subject
  • Semiconductors > Testing > Congresses
  • Spectrum analysis > Congresses
ISBN
0819414360
LCCN
93087142
Owning Institutions
Princeton University Library