Research Catalog
Imaging and illumination for metrology and inspection : 2-4 November 1994, Boston, Massachusetts /
- Title
- Imaging and illumination for metrology and inspection : 2-4 November 1994, Boston, Massachusetts / Donald J. Svetkoff, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering.
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| Status | Format | Access | Call Number | Item Location |
|---|---|---|---|---|
Not available - Please for assistance. | Text | Use in library | TA1632 .I443 1995 | Off-site |
Details
- Additional Authors
- Description
- vii, 276 p. : ill.; 28 cm.
- Series Statement
- SPIE proceedings series ; v. 2348
- Subjects
- ISBN
- 0819416835
- LCCN
- 94067545
- Owning Institutions
- Princeton University Library