Research Catalog
12th IEEE VLSI Test Symposium : April 25-28, 1994, Cherry Hill, New Jersey : proceedings /
- Title
- 12th IEEE VLSI Test Symposium : April 25-28, 1994, Cherry Hill, New Jersey : proceedings / sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Philadelphia Section.
- Author
- IEEE VLSI Test Symposium (12th : 1994 : Cherry Hill, N.J.)
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Status | Format | Access | Call Number | Item Location |
---|---|---|---|---|
Not available - Please for assistance. | Text | Use in library | TK7874.I3274 1994 | Off-site |
Details
- Additional Authors
- Description
- xviii, 466 p. : ill.; 28 cm.
- Subject
- Integrated circuits > Very large scale integration > Testing > Congresses
- ISBN
- 0818654406 (pbk.)
- LCCN
- 94075000
- Owning Institutions
- Princeton University Library