Research Catalog

12th IEEE VLSI Test Symposium : April 25-28, 1994, Cherry Hill, New Jersey : proceedings /

Title
12th IEEE VLSI Test Symposium : April 25-28, 1994, Cherry Hill, New Jersey : proceedings / sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Philadelphia Section.
Author
IEEE VLSI Test Symposium (12th : 1994 : Cherry Hill, N.J.)

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Details

Additional Authors
  • IEEE Computer Society. Test Technology Technical Committee. http://id.loc.gov/authorities/names/n88164000
  • Institution of Electrical and Electronics Engineers. Philadelphia Section.
Description
xviii, 466 p. : ill.; 28 cm.
Subject
Integrated circuits > Very large scale integration > Testing > Congresses
ISBN
0818654406 (pbk.)
LCCN
94075000
Owning Institutions
Princeton University Library