Research Catalog
Proceedings of the Third Asian Test Symposium, November 15-17, 1994, Nara, Japan /
- Title
- Proceedings of the Third Asian Test Symposium, November 15-17, 1994, Nara, Japan / sponsored by IEEE Computer Society Test Technology Technical Committee in cooperation with Technical Group on Fault Tolerant Systems (IEICE) ... [et al.].
- Author
- Asian Test Symposium (3rd : 1994 : Nara, Japan)
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Status | Format | Access | Call Number | Item Location |
---|---|---|---|---|
Not available - Please for assistance. | Text | Use in library | TK7888.4 .A85 1994 | Off-site |
Details
- Additional Authors
- IEEE Computer Society. Test Technology Technical Committee. http://id.loc.gov/authorities/names/n88164000
- Description
- xiv, 392 p. : ill.; 28 cm.
- Subject
- ISBN
- 0818666900 (paper)
- 0818666919 (microfiche)
- Owning Institutions
- Princeton University Library