Research Catalog

Title

Thin films : stresses and mechanical properties VI : symposium held April 8-12, 1996, San Francisco, California, U.S.A. / editors, William W. Gerberich [and others].

Publication

Pittsburgh, Pa. : Materials Research Society, ©1997.

Items in the Library & Off-site

Details

Additional Authors

• Gerberich, William W.
• Materials Research Society.

Description

xv, 542 pages : illustrations; 24 cm

Series Statement

Materials Research Society symposium proceedings ; v. 436

Uniform Title

Materials Research Society symposia proceedings ; v. 436.

Subject

• Thin films > Mechanical properties > Congresses
• Thin films > Mechanical properties
• Dünne Schicht
• Epitaxieschicht
• Mechanische Eigenschaft
• Oxide
• Kongreß

Genre/Form

• Conference papers and proceedings.
• Boston (Mass., 1995)
• San Francisco (Calif., 1996)

Note

• "[P]apers presented ... at the 1996 MRS Spring Meeting"--Pref.

Bibliography (note)

• Includes bibliographical references and indexes.

Contents

• Near-Plastic Threshold Indentation and the Residual Stress in Thin Films / J.E. Houston and T.A. Michalske -- Structural Transformations During Growth of Epitaxial Fe(001) Thin Films on Cu(001) and Pt(001) / B.M. Clemens, T.C. Hufnagel and M.C. Kautzky -- Microstructure and Mechanical Properties of Thin Al-Si-Ge Films / S. Kirchner, O. Kraft and S.P. Baker -- The Influence of Strengthening Mechanisms on Stress Relaxation in Thin Aluminum Metallization / Jonathan Gorrell, Paul Holloway and Hal Jerman -- Film Thickness Effect on Tensile Properties and Microstructures of Submicron Aluminum Thin Films on Polyimide / Y.S. Kang, P.S. Ho and R. Knipe -- Microhardness Study of Cathode-Mounted Amorphous Hydrogenated Boron Carbide / Shu-Han Lin, Dong Li and Bernard J. Feldman -- Mechanical Properties of CuNi Films / W. Bruckner, F. Macionczyk and G. Reiss -- Investigation of the Elastic Modulus of Sol-Gel Derived Titania Using Three-Point Bending Tests / A.K. Jamting, J.M. Bell and M.V. Swain -- Plastic Deformation in Thin Copper Films Determined by X-ray Microtensile Tests / A. Kretschmann, W.-M. Kuschke and S.P. Baker -- Growth, Structure, and Mechanical Properties of Pulsed Laser Deposited TiN/TiB[subscript 2] Microlaminates / Ashok Kumar, R.B. Inturi and U. Ekanayake -- Dependence of Hardness and Stiffness on Density of Ta[subscript 2]O[subscript 5] and TiO[subscript 2] Layers / S.P. Baker, C.R. Ottermann and M. Laube -- Fracture of Thin Synthetic Diamond Films / M.D. Drory -- Effect of In- and Out-of-Plane Stresses During Indentation of Diamond Films on Metal Substrates / D.F. Bahr and W.W. Gerberich -- A Model of Cleavage Fracture along Metal/Ceramic Interfaces / D.M. Lipkin, G.E. Beltz and D.R. Clarke -- Fracture of Thin Tantalum Nitride Films on AlN Substrates / N.R. Moody, D. Medlin and D.P. Norwood -- Mechanics of Interfacial Crack Propagation in Microscratching / Maarten P. de Boer, John C. Nelson and William W. Gerberich -- Microscratch Analysis of the Adhesion Failure on Oxide Thin Films with Different Thickness / C.R. Ottermann, K. Bange and A. Braband -- Measuring Interfacial Fracture Toughness with the Blister Test / R.J. Hohlfelder, H. Luo and J.J. Vlassak -- Effects of Mechanical Properties of Metal Films on the Adhesion Strength of Cr/Polyimide Interfaces / Jin Won Choi and Tae Sung Oh -- Influence of Cu Deposition Conditions on the Microstructure and Adhesion of Cu/Cr Thin Film to Polyimide Film / Cheol-Ho Joh and Young-Ho Kim -- Peel Strength in the Cu/Cr/Polyimide System / I.S. Park, Jin Yu and Y.B. Park -- Finite Element Studies of the Influence of Pileup on the Analysis of Nanoindentation Data / A. Bolshakov, W.C. Oliver and G.M. Pharr -- Indenter Geometry Effects on the Measurement of Mechanical Properties by Nanoindentation with Sharp Indenters / T.Y. Tsui, W.C. Oliver and G.M. Pharr -- Dislocation Nucleation and Multiplication During Nanoindentation Testing / A.B. Mann and J.B. Pethica -- Nanoindentation Studies of Yield Point Phenomena on Gold Single Crystals / S.G. Corcoran, R.J. Colton and E.T. Lilleodden -- Evolution of the Contact Area During an Indentation Process / Kangjie Li, T.W. Wu and J.C.M. Li -- Mechanical Property Data for Coated Systems -- The Prospects for Measuring "Coating Only" Properties Using Nanoindentation / S.V. Hainsworth and T.F. Page -- Probing Silicate/Sapphire Interfaces with AFM and Nanoindentation / E.T. Lilleodden, A.V. Zagrebelny and S. Ramamurthy -- Stress Reduction in PACVD Amorphous-Diamond Coatings by Boron Addition / V. Wagner, E.H.A. Dekempeneer and J. Geurts -- Inaccuracies in Sneddon's Solution for Elastic Indentation by a Rigid Cone and Their Implications for Nanoindentation Data Analysis / A. Bolshakov and G.M. Pharr -- The Effect of Ta and N Content on Mechanical Properties of DC Magnetron Sputtered FeN and FeTaN Thin Films / Hong Deng, M. Kevin Minor and John A. Barnard -- Nanoscale Creep and the Role of Defects / S.A. Syed Asif and J.B. Pethica -- Nanoindentation of Soft Films on Hard Substrates: The Importance of Pileup / T.Y. Tsui, W.C. Oliver and G.M. Pharr -- Mechanical Properties of CaF[subscript 2] Single Crystal Substrates Determined from Nanoindentation Techniques / A. Aruga, R.B. Inturi and J.A. Barnard -- In Situ TEM Investigation During Thermal Cycling of Thin-Copper Films / R.-M. Keller, W. Sigie and S.P. Baker -- Micromechanical Tensile Testing / S. Greek, F. Ericson and S. Johansson -- Time-Dependent Deformation During Indentation Testing / B.N. Lucas, W.C. Oliver and G.M. Pharr -- Stress Distribution in Si Under Patterned Thin Film Structures / S.P. Wong, L. Huang and W.S. Guo -- Nonlinear Acoustic Response in Thin Oxide Layers on Fused Silica / C.R. Ottermann, S.U. Fassbender and W. Arnold -- Young's Modulus and Density of Thin TiO[subscript 2] Films Produced by Different Methods / C.R. Ottermann, R. Kuschnereit and O. Anderson -- Simultaneous Overall and Local Stress Analysis of Thin Metal Films by Light Scattering and Beam Deflection Measurements / C. Kylner and L. Mattsson -- Simulation of Mechanical Deformation and Tribology of Nanothin Amorphous Hydrogenated Carbon (a:CH) Films Using Molecular Dynamics / J.N. Glosli, M.R. Philpott and J. Belak -- Tribology Studies of Organic-Thin Films by Scanning Force Microscopy / G. Bar, S. Rubin and A.N. Parikh -- Hardness and Deformation Mechanisms of Highly Elastic Carbon Nitride Thin Films as Studied by Nanoindentation / S.V. Hainsworth, H. Sjostrom and T.F. Page -- Effect of Film Thickness and Substrate Surface Treatment on Substrate Deformation: DLC on MgO / A. Strojny, E.T. Lilleodden and G. Wang -- Hard Amorphous Hydrogenated Carbon Films Deposited from an Expanding Thermal Plasma / J.W.A.M. Gielen, M.C.M. van de Sanden and W.M.M. Kessels -- Tribological Properties of Tetrahedral Carbon Films Deposited by Filtered Cathodic Vacuum Arc Technique / Shi Xu, B.K. Tay and D.I. Flynn -- Adhesion Study of DLC/Cr/DLC and DLC/Ti/DLC Sandwich Structures on Hardened Steel / U. Muller and R. Hauert -- Tribological Properties of Nitrogen-Implanted and Boron-Implanted Steels / K.T. Kern, K.C. Walter and S. Fayeulle -- Characterization of the Mechanical and Tribological Properties of Sputtered a:SiC Thin Films / T.W. Scharf, R.B. Inturi and J.A. Barnard -- Thermal Properties of Magnetron Sputtered TiN and TiAlN Thin Films on HSS / E. Lugscheider, O. Knotek and C. Barimani -- Copper Grown Diamond Films / E. Pereira, Qi Hua Fan and J. Gracio -- The Study of Tribological Performance and Surface Film Characterization of Bismuth Dioctyldithiocarbamate / Ligong Chen, Junxiu Dong and Guoxu Chen -- In Situ Electron Spectroscopic Identification of Carbon Species Deposited by Laser Ablation / E.C. Samano, Gerardo Soto and Arturo Gamietea -- Mechanical Properties of Pure Carbon and Carbon-Nitrogen Coatings on Thin Film Head Sliders / G. Wang, A. Strojny and J.M. Sivertsen -- Viscoelastic Properties of Healthy Human Artery Measured in Saline Solution by AFM-Based Indentation Technique / A. Lundkvist, E. Lilleodden and W. Siekhaus -- Microindentation Using Strain Rate Sensitivity to Examine Deformation of Polymeric and Metallic Surface Layers / W.R. Newson, B.J. Diak and S. Saimoto -- Thin Film Polymer Stress Measurement Using Piezoresistive Anisotropically Etched Pressure Sensors / G. Bitko, R. Harries and J. Matkin -- Capillary Stress in Microporous Thin Films / J. Samuel, A.J. Hurd and C.J. Brinker -- Measurement of Low-K Polymer/Metal Interfacial Toughness Using 4-Point Bending Method / Qing Ma, Chuanbin Pan and Harry Fujimoto -- Detection of Similar Elastic Properties Using a Magnetic Force Controlled AFM / Shin-ichi Yamamoto, Hirofumi Yamada and Suzanne P. Jarvis -- The Mechanics of a Free-Standing Strained Film/Compliant Substrate System / L.B. Freund
• An Analysis of Void Nucleation in Passivated Interconnect Lines Due to Vacancy Condensation and Interface Contamination / R.J. Gleixner and W.D. Nix -- Finite Element Modeling of Grain Aspect Ratio and Strain Energy Density in a Textured Copper Thin Film / R.P. Vinci and J.C. Bravman -- Measurements of Stress Evolution During Thin Film Deposition / E. Chason and J.A. Floro -- Relationship Between Void and Hillock Formation and Grain Growth in Thin Aluminum Films / O.V. Kononenko and V.N. Matveev -- Analysis of Stresses and Strains in Passivated Metal Lines / I. Eppler, H. Schroeder and U. Burges -- Processing-Induced Stresses and Curvature in Patterned Lines on Silicon Wafers / Y.-L. Shen, S. Suresh and I.A. Blech -- Isothermal Stress Relaxation in Al, AlCu and AlVPd Films / J.P. Lokker, J.F. Jongste and G.C.A.M. Janssen -- The Effect of the Passivation Material on the Stress and Stress Relaxation Behavior of Narrow Al-Si-Cu Lines / A. Witvrouw, P. Flinn and K. Maex -- Thermal- and Electromigration-Induced Stresses in Passivated Al- and AlSiCu-Interconnects / D. Beckers, H. Schroeder and I. Eppler -- Stress in Sputtered CO[subscript 90]Fe[subscript 10]/Ag GMR Multilayers / J.D. Jarratt, V.R. Inturi and J.L. Weston -- Reversible Force-Resistivity Behavior of Thin Films of the TTF-TCNQ Family / W. Vollmann and H.-U. Sonntag -- Strain, Structure and Electronic States in MBE Grown (Nb, Ti)O[subscript 2] Mixed Rutile / S.A. Chambers, Y. Gao and S. Thevuthasan -- Anisotropic Behaviour of Surface Roughening in Lattice Mismatched Heteroepitaxial Thin Films / Cengiz S. Ozkan, William D. Nix and Huajian Gao -- Calculation of Equilibrium Island Morphologies for Strained Epitaxial Systems / R.V. Kukta and L.B. Freund -- Indentation Modulus and Hardness in Heteroepitaxial Al[subscript x]Ga[subscript 1-x]P Films / B. Roos, C.J. Santana and C.R. Abernathy -- Origins of Residual Stress in Mo and Ta Films: The Role of Impurities, Microstructural Evolution, and Phase Transformations / L.J. Parfitt, O.P. Karpenko and Z.U. Rek -- Stress Determination in Thermally Grown Alumina Scales Using Ruby Luminescence / D. Renusch, B.W. Veal and I. Koshelev -- Morphological Instability of SiC Film During Carbonization / C.-H. Chiu and L.B. Freund -- Stress Analysis of Titanium Dioxide Films by Raman Scattering and X-ray Diffraction Methods / Li-jian Meng and M.P. dos Santos -- Effect of Thickness and Annealing on Stress in Tantalum and Tantalum Nitride Thin Film Hard Coatings / Ranjana Saha, Rama B. Inturi and John A. Barnard.

ISBN

• 1558993398
• 9781558993396

OCLC

• ocm36471587
• 36471587
• SCSB-9185898

Owning Institutions

Princeton University Library