Research Catalog
Trace characterization, chemical and physical
- Title
- Trace characterization, chemical and physical / W. Wayne Meinke and Bourdon F. Scribner, editors, Institute for Materials Research.
- Author
- Materials Research Symposium (1st : 1966 : Gaithersburg, Md.)
- Publication
- Washington D.C. : Dept. of Commerce, National Bureau of Standards, 1967.
Items in the Library & Off-site
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1 Item
| Status | Format | Access | Call Number | Item Location |
|---|---|---|---|---|
| Text | Use in library | 8240.622.1966 | Off-site |
Details
- Additional Authors
- Description
- xiii, 580 pages : illustrations; 25 cm.
- Summary
- A symposium on Trace Characterization, Chemical and Physical was held at the National Bureau of Standards October 3-7, 1966.The volume contains the texts of invited lectures, and summaries by the rapporteurs of the contributed papers and discussion sessions.Topics covered include trace characterization and the properties of materials; electrical measurements; electrochemical methods; optical and x-ray spectroscopy; x-ray diffraction; optical methods; chemical spectrophotometry; nuclear methods; mass spectroscopy; preconcentration; sampling and reagents; and electron and optical microscopy.(Author).
- Series Statement
- National Bureau of Standards monograph ; 100
- Uniform Title
- NBS monograph ; 100.
- Subject
- Genre/Form
- Conference papers and proceedings
- Technical reports.
- Conference papers and proceedings.
- Note
- "Based on lectures and discussions of the 1st Materials Research Symposium held at the NBS, Gaithersburg, Maryland, October 3-7, 1966."
- Bibliography (note)
- Includes bibliographies.
- Additional Formats (note)
- Also available in an electronic version.
- Contents
- Trace characterization and the properties of materials / Hannay, N.B. -- Electrical measurements for trace characterization / Weisberg, L.R. -- Trace characterization by electrochemical methods / Laitinen, H.A. -- Optical and x-ray spectroscopy / Addink, N.W.H. -- Effects of trace impurities on x-ray diffraction / Chikawa, J, and Newkirk, J.B. -- Chemical spectrophotometry in trace characterization / West, T.S. -- Radioactivity techniques in trace characterization / Smales, A.A. -- Spark source mass spectrometric analysis of solids / Ahearn, A.J. -- Preconcentration in trace analysis / Minczewski, J. -- The study of crystal imperfections by means of optical methods and by means of electron microscopy and electron diffraction / Amelinckx, S.
- LCCN
- 66062907
- OCLC
- ocm00425883
- 425883
- SCSB-233518
- Owning Institutions
- Princeton University Library