Research Catalog

Proceedings

Title
Proceedings / Advanced Techniques in Failure Analysis Symposium, 1976, 20-21 February 1976, Sheraton Hotel, Newport Beach, California, USA ; sponsored by the IEEE Reliability Group, G7, Los Angeles Chapter [and others].
Author
Advanced Techniques in Failure Analysis Symposium (1976 : Newport Beach, Calif.)
Publication
[Place of publication not identified] : Los Angeles chapters of the Reliability and Parts, Hybrids & Packaging Groups, Institute of Electrical and Electronics Engineers, [1976]

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Details

Additional Authors
IEEE Reliability Group. Los Angeles Chapter.
Description
iii, 116 p. : ill.; 28 cm.
Alternative Title
Failure analysis
Subject
  • Semiconductors > Defects > Congresses
  • Semiconductors > Testing > Congresses
  • Microscope and microscopy > Congresses
  • Semi-conducteurs > Défauts > Congrès
  • Semi-conducteurs > Essais > Congrès
  • Semiconductors > Defects
  • Semiconductors > Testing
Genre/Form
Conference papers and proceedings.
Note
  • "IEEE Catalog No. 76CH1092-GREG6."
Bibliography (note)
  • Includes bibliographical references.
OCLC
  • ocm02654499
  • 2654499
  • SCSB-244236
Owning Institutions
Princeton University Library