Research Catalog

Speckle metrology

Title
Speckle metrology / edited by Robert K. Erf.
Publication
New York : Academic Press, 1978.

Items in the Library & Off-site

Filter by

1 Item

StatusFormatAccessCall NumberItem Location
Request for On-site UseRequest Scan
How do I pick up this item and when will it be ready?
TextUse in library TA418.7.S67Off-site

Details

Additional Authors
Erf, Robert K.
Description
xiv, 331 pages : illustrations; 24 cm.
Series Statement
Quantum electronics--principles and applications
Uniform Title
Quantum electronics--principles and applications.
Subject
  • Speckle metrology
  • shearography
  • Laser
  • Quantenoptik
  • Speckle-Interferometrie
  • Granularité (optique)
  • Interférométrie par granularité
Genre/Form
  • Speckle-Metrologie.
  • Speckle-Metrology.
Bibliography (note)
  • Includes bibliographical references and index.
ISBN
  • 0122413601
  • 9780122413605
LCCN
78000206
OCLC
  • ocm03948958
  • 3948958
  • SCSB-9177515
Owning Institutions
Princeton University Library