Research Catalog

Properties of porous silicon

Title
Properties of porous silicon / edited by Leigh Canham.
Publication
London, U.K. : IEE, INSPEC, ©1987.

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StatusFormatAccessCall NumberItem Location
TextUse in library QD181.S6 P766 1997Off-site

Details

Additional Authors
  • Canham, Leigh T.
  • INSPEC (Information service)
Description
xviii, 405 pages : illustrations; 29 cm.
Series Statement
EMIS datareviews series ; no. 18
Uniform Title
EMIS datareviews series ; no. 18.
Subject
  • Porous silicon
  • Semiconductors
  • semiconductor
  • POROUS SILICON
  • SILICON
  • TECHNOLOGIES
  • INDUSTRIES
  • Semiconducteurs
  • Optoélectronique
  • Silicium
  • Matériaux poreux
Bibliography (note)
  • Includes bibliographies and index.
Contents
1. Fabrication and processing -- 2. Porosity -- 3. Skeleton structure -- 4. Mechanical and thermal properties -- 5. Chemical composition -- 6. Electrical properties -- 7. Electronic bandstructure -- 8. Optical constants -- 9. Luminescent properties -- 10. Optoelectronic properties -- 11. Defects and impurities -- 12. Application areas.
ISBN
  • 0852969325
  • 9780852969328
OCLC
  • ocm38206806
  • 38206806
  • SCSB-9454724
Owning Institutions
Princeton University Library