Research Catalog

Diffraction and imaging techniques in material science

Title
Diffraction and imaging techniques in material science / editors, S. Amelinckx, R. Gevers, J. Van Landuyt.
Publication
Amsterdam ; New York : North-Holland Pub. Co. : Sole distributors for the U.S.A. and Canada, Elsevier North-Holland, 1978.

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2 Items

StatusVol/DateFormatAccessCall NumberItem Location
vol.2TextUse in library TA417.23 .D54 1978 vol.2Off-site
vol.1TextUse in library TA417.23 .D54 1978 vol.1Off-site

Details

Additional Authors
  • Amelinckx, S. (Severin)
  • Gevers, R.
  • Landuyt, J. van.
  • International Summer Course on Material Science (1969 : Antwerp, Belgium). Modern diffraction and imaging techniques in material science.
Description
2 volumes (xvii, 847 pages, [1] folded leaf of plates) : illustrations; 23 cm
Subject
  • Electron microscopy > Congresses
  • Electrons > Diffraction > Congresses
  • Imaging systems > Congresses
  • Electron microscopy
  • Electrons > Diffraction
  • Imaging systems
  • Elektronenmicroscopie
  • Afbeeldingen (algemeen)
  • MICROSCÓPIO ELETRÔNICO (CONGRESSOS)
Genre/Form
Conference papers and proceedings
Note
  • Comprises new contributions and revised and updated papers originally presented at the International Summer Course on Material Science, Antwerp, 1969, and published in 1970 under title: Modern diffraction and imaging techniques in material science.
Bibliography (note)
  • Includes bibliographical references and index.
Contents
v. 1. Electron microscopy.--v. 2. Imaging and diffraction techniques.
ISBN
  • 0444851305
  • 9780444851307
  • 0444851283
  • 9780444851284
  • 0444851291
  • 9780444851291
LCCN
78022081
OCLC
  • ocm04504580
  • 4504580
  • SCSB-9171240
Owning Institutions
Princeton University Library