Research Catalog

Secondary ion mass spectrometry : SIMS IV : proceedings of the fourth international conference, Osaka, Japan, November 13-19, 1983

Title
Secondary ion mass spectrometry : SIMS IV : proceedings of the fourth international conference, Osaka, Japan, November 13-19, 1983 / editors: A. Benninghoven [and others].
Author
International Conference on Secondary Ion Mass Spectrometry (4th : 1983 : Osaka, Japan)
Publication
Berlin ; New York : Springer-Verlag, 1984.

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StatusFormatAccessCall NumberItem Location
TextUse in library QD96.S43 I58 1984Off-site

Details

Additional Authors
  • Benninghoven, A.
  • Nihon Gakujutsu Shinkōkai.
Description
xv, 503 pages : illustrations; 24 cm.
Series Statement
Springer series in chemical physics ; 36
Uniform Title
Springer series in chemical physics ; v. 36.
Subject
  • Secondary ion mass spectrometry > Congresses
  • Secondary ion mass spectrometry
Genre/Form
Conference papers and proceedings
Bibliography (note)
  • Includes bibliographical references and index.
ISBN
  • 038713316X
  • 9780387133164
LCCN
84005330
OCLC
  • ocm10557609
  • 10557609
  • SCSB-98923
Owning Institutions
Princeton University Library