Research Catalog
Secondary ion mass spectrometry : SIMS IV : proceedings of the fourth international conference, Osaka, Japan, November 13-19, 1983
- Title
- Secondary ion mass spectrometry : SIMS IV : proceedings of the fourth international conference, Osaka, Japan, November 13-19, 1983 / editors: A. Benninghoven [and others].
- Author
- International Conference on Secondary Ion Mass Spectrometry (4th : 1983 : Osaka, Japan)
- Publication
- Berlin ; New York : Springer-Verlag, 1984.
Items in the Library & Off-site
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1 Item
Status | Format | Access | Call Number | Item Location |
---|---|---|---|---|
Text | Use in library | QD96.S43 I58 1984 | Off-site |
Details
- Additional Authors
- Description
- xv, 503 pages : illustrations; 24 cm.
- Series Statement
- Springer series in chemical physics ; 36
- Uniform Title
- Springer series in chemical physics ; v. 36.
- Subject
- Genre/Form
- Conference papers and proceedings
- Bibliography (note)
- Includes bibliographical references and index.
- ISBN
- 038713316X
- 9780387133164
- LCCN
- 84005330
- OCLC
- ocm10557609
- 10557609
- SCSB-98923
- Owning Institutions
- Princeton University Library