Research Catalog

Particle characterization in technology

Title
Particle characterization in technology / editor, John Keith Beddow.
Publication
Boca Raton, Fla. : CRC Press, ©1984.

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vol. 1TextUse in library TA418.78 .P36 vol. 1Off-site

Details

Additional Authors
Beddow, John K.
Description
2 v. : ill.; 26 cm.
Series Statement
  • CRC series on fine particle science and technology
  • Uniscience series on fine particle science and technology
Uniform Title
  • CRC series on fine particle science and technology.
  • Uniscience series on fine particle science and technology.
Subject
  • Particles
  • Bulk solids
  • Particle size determination
  • Particulate matter
  • Electron microscopy
  • Particle Size
  • Microscopy, Electron
  • Particulate Matter
  • electron microscopy
  • Particulate matter
  • Electron microscopy
  • Bulk solids
  • Particle size determination
  • Particles
  • Particules
  • Solides en vrac
  • Granulométrie
Bibliography (note)
  • Includes bibliographies and indexes.
Contents
v. 1. Applications and microanalysis -- v. 2. Morphological analysis.
ISBN
  • 0849357845
  • 9780849357848
  • 0849357853
  • 9780849357855
LCCN
83014363
OCLC
  • ocm11143470
  • 11143470
  • SCSB-9179931
Owning Institutions
Princeton University Library