Research Catalog

Second breakdown in semiconductor devices : a bibliography

Title
Second breakdown in semiconductor devices : a bibliography / Harry A. Schafft.
Author
Schafft, Harry A.
Publication
[Washington, D.C.] : National Bureau of Standards, 1967.

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Details

Additional Authors
  • Institute for Applied Technology (U.S.)
  • United States. National Bureau of Standards.
Description
40 pages : illustrations; 27 cm.
Summary
Almost 200 references with appropriate key words are listed which provide, it is believed, a comprehensive coverage of the literature of second breakdown in transistors and other semiconductor devices from 1958 through much of 1967.A representative list of earlier papers dealing with what appears to be second breakdown in point-contact and p-n junction diodes is also included.The indexes consist of an author index and an index to subject matter with reference tabulations and with key word assignments.(Author).
Series Statement
NBS technical note ; 431
Uniform Title
NBS technical note ; 431.
Subject
  • Semiconductor storage devices > Bibliography
  • Semiconductor storage devices
Genre/Form
  • technical reports.
  • bibliographies.
  • Bibliographies
  • Technical reports.
  • Bibliographies.
  • Rapports techniques.
Note
  • October 1967.
  • Electronic Instrumentation Division, Institute for Applied Technology.
OCLC
  • ocm09039621
  • 9039621
  • SCSB-715826
Owning Institutions
Princeton University Library